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BEAMLINE (BEAMLINE NUMBER)
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ENERGY:FLUX |
SOURCE |
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Infrared Spectromicroscopy (1.4.3)
Biological, environmental, particulate, and forensic sciences resolution: ~1 µm spatial, 0.125 cm-1 energy
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0.05-1.0 eV |
Bend |
|
Calibration/Standards/Optics/Solid State Chem. (6.3.1)
Chemical and Materials Science (9.3.2)
Atomic, Molecular, and Materials (9.3.1)
XAFS om 6.3.1 amd 9.3.1,
NEXAFS/photoemission at 9.3.2
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500-2000 eV:1011 photons/s
30-1400 eV: 1011 photons/s
2.2-6.0 keV: 1011 photons/s
|
|
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High-resolution Zone Plate Microscopy (6.1.2)
Spectromicroscopy, NEXAFS transmission x-ray imaging for biological, environmental, and material sciences
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300-900 eV: 1k2 pixels, 1k photos/pixel in 3s at 517 eV
|
Bend
|
| Surface and Materials Science (7.0.1)
Soft x-ray exmission, SPEM, spin spectrometer for PES, ultraESCA, and NEXAFS for materials sciences
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60-1200 eV:1012 photons/s at 0.01% BW
|
Bend
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| Microdiffraction (7.3.3)
Micro XPS, NEXAFS, MCD, 1 µm spatial res. and E/DE =~ 1800
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6 keV-12 keV:
109 photons/s
in 1 µm x 1 µm spot
|
Bend
|
|
|
65-1400 eV:
1011-1015 photons/s pr res. and energy 100 µm spot |
Undulator |
| Tomography (8.3.2)
Conventional radiography: 10-45 keV, ~1 µm spatial res. Zone-plate microscope: 3-15 keV, 0.1 µm spatial res.
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3-45 keV
|
Superbend |
| X-ray Fluorescence MicroProbe (10.3.1)
Trace element imaging analysis with 1 µm spatial res. for particulates, environmental, biological, and materials samples
|
3-20 keV:
3 x 1010 photons/s at 12.5 keV |
Bend |
| microX-ray Absorption Spectroscopy (10.3.2)
Spectromicroscopy with 3 mm spatial resolution and (E/D E) ~7000, 7 element fluorescence detector, solid samples
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3-17 keV: photons/s/0.03% BW in 5 µm spot |
Bend |
| Chemical Dynamics (9.0.2)
Molecular beam photoelectron/photoion imaging and spectroscopy
|
1016 photons/s/2.5% BW spot size 50 x 170 µm |
Undulator
10 cm |
