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Characteristics
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200-1900 eV
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Variable-included-angle PGM, Calculated Flux ~1012 photons/s, Resolving Power (1.9 GeV, 400 mA) E/DE 2500–7500
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Used to make x-ray images and NEXAFS spectra of thin samples in transmission
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Spatial Resolution
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Scanning microscope with focusing by means of Fresnel zone plates; resolution determined by spot size, which is 40 nm with current zone plates but will improve with new zone plates.
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Spot size at sample
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40 nm with current zone plates
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Samples
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Thin sections or films (100 nm thick), 3 x 3 mm in area
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Sample Environment
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Helium at 1 atmosphere
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Special Notes
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Samples may be wet or dirty: thin films may be deposited on silicon nitride windows; optical alignment is provided by looking at the back side of the sample to locate regions of interest from optical micrographs
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Scientific Applications
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Molecular environmental science, polymer studies, studies of biofilms
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Experimental Techniques
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Imaging, NEXAFS in small spots
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